Case Study
Universal ATE for Industrial I/O Cards
The core of this case is not a list of instruments, but a Universal Multi-Function Test Platform. One ATE platform needs to adapt to analog input, analog output, digital input, digital output, isolated power/digital power supply, analog sensor, temperature/humidity control, flow sensor and pressure sensor control cards.
Case system visualIndustrial I/O universal ATE platform architecture diagram
Test SoftwareInstrumentationFixtureDUTTraceability
Software, instrumentation, fixture, DUT and production data integration.Project Overview
Universal multi-function ATE platform case for industrial I/O, sensor-control and power-related cards, covering analog, digital, communication, power, boundary scan, signal generation and switching resources.
Testing Requirements
- Adapt one ATE platform to multiple industrial I/O and sensor-control card types.
- Organize test resources by analog, digital, communication, power, boundary scan, signal generation and switching.
- Integrate standard instruments, NI modules, custom relay cards and communication PCB, with fixtures adapted to different DUTs.
System Architecture
Test SoftwareTestStand / LabVIEWDAQ / DIO / Communication / JTAGPower / Load / Switch / ScopeInterchangeable FixtureIndustrial I/O DUT
Key Test Items
Analog Input CardsAnalog Output CardsDigital Input CardsDigital Output CardsIsolated Power / Digital Power SupplyAnalog Sensor CardsTemperature / Humidity Control CardsFlow Sensor CardsPressure Sensor Control Cards
Engineering Challenges
- Multiple I/O card types need to share one ATE platform.
- Different measurement, communication, power and boundary scan resources need unified scheduling.
- Standard instruments and onTAP-designed boards need to be integrated together.
- Fixtures and test programs need to adapt to different DUT models.
Implementation
- NI LabVIEW and NI TestStand are used to organize automated test flow, resource calls and result judgment.
- Project-configured resources include Chroma electronic load, Agilent AC/DC source, Sorensen DC source, Agilent DMM, switch matrix, oscilloscope, NI DIO, NI 6259, NI USB-422, NI CAN, Total Phase SPI/I2C adapter, JTAG Boundary Scan, IPC, onTAP customized relay cards, onTAP communication PCB and frequency generator.
- Interchangeable fixtures connect different industrial I/O DUT types, while platform resources are called according to project configuration.
Engineering Outcome
- A universal multi-function ATE platform was built for multiple industrial I/O card types.
- Test resources are organized by category, supporting future DUT expansion and engineering maintenance.
- The resource list is presented as Project Configuration, not as an onTAP standard BOM or general specification.
Related Solutions
Related Engineering Capabilities
InstrumentationCommunicationHardwareSoftwareSystem Integration
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